Publications about SALVE

  1. Haider, M., Hartel, P., & Mueller, H. (2013). Developments of Aberration Correction Systems for High Resolution EM. MSC 2013 40th Microscopical Society of Canada Congress 18-21 June Victoria, BC, Canada, 2 pages.

  2. Reich, E. S. (2013). Imaging hits noise barrier. Nature, 499: 135–136. PDF

  3. Spence, J. C. H. (2013), High-resolution electron microscopy (4th Editio., pp. 1–406). Oxford: Oxford University Press.

  4. Central Facility Electron Microscopy, University of Ulm (2012). Delving Deeper into the "Nano Cosmos" of the Battery. German National Bibliography, 28–29. PDF

  5. Colliex, C., Gloter, A., March, K., Mory, C., Stephan, O., Suenaga, K., & Tence, M. (2012). Capturing the signature of single atoms with the tiny probe of a STEM. Ultramicroscopy, 123: 80–89. doi: 10.1016/j.ultramic.2012.04.003. PDF

  6. Sato, Y., Sasaki, T., Sawada, H., Hosokawa, F., Tomita, T., Kaneyama, T., Kondo, Y., et al. (2012). Innovative electron microscope for light-element atom visualization. Synthesiology English edition, 4: 172–182. PDF

  7. Mullerova, I., Hovorka, M., Konvalina, I., Uncovsky, M., & Frank, L. (2011). Scanning transmission low-energy electron microscopy. IBM Journal of Research and Development, 55:2.1 – 2.6. doi: 10.1147/JRD.2011.2156190.

  8. Pokrant, S., Orchowski, A., Benner, G., Cheynet, M., & Kaiser, U. A. (2011). Results on 20kV Spectroscopy with Monochromation and In-Column Filter. Microscopy and Microanalysis, 17: 1186–1187. doi: 10.1017/S1431927611006805.

  9. Rose, H. (2010). Theoretical aspects of image formation in the aberration-corrected electron microscope. Ultramicroscopy, 110(5), 488–499. doi: 10.1016/j.ultramic.2009.10.003. PDF

  10. Rose, H. H. (2009). Future trends in aberration-corrected electron microscopy. Philosophical Transactions A, 367, 3809–3823. doi: 10.1098/rsta.2009.0062. PDF

  11. Segal, M. (2009). Surely you’re happy, Mr. Feynman! Nature Nanotechnology, 4: 786–788. doi: 10.1038/nnano.2009.360. PDF